Method for measuring an object
US9025855B1 · kind B1 · utility
19Cited by
3References
29Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Feb 19, 2010 |
| Grant date | May 5, 2015 |
| Priority date | — |
| Expiry date | Sep 11, 2031 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2223/66
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for determining structures or geometry of an object, or for measuring an object using a CT measuring system, and for correcting projection data for a CT reconstruction with the application of a CT detector, wherein the CT measuring system includes at least one radiation source, at least one radiation detector, and at least one axis of rotation.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.