Depth camera system with machine learning for recognition of patches within a structured light pattern
US9025863B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Jun 27, 2013 |
| Grant date | May 5, 2015 |
| Priority date | — |
| Expiry date | Aug 14, 2033 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04N13/271
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
Generally, this disclosure provides systems, devices, methods and computer readable media for a depth camera with ML techniques for recognition of patches within an SL pattern. The system may include a projection module to project an ML-based SL pattern onto a scene; a camera to receive an image of the SL pattern reflected from the scene; a patch recognition and location module to generate a descriptor vector for a patch segmented from the received image and to query an ML system with the descriptor vector, the ML system configured to provide a patch label associated with the descriptor vector, the patch label comprising a location of the patch relative to the projected SL pattern; and a depth estimation module to triangulate a distance between the camera and a region of the scene associated with the patch based on the location of the patch relative to the projected SL pattern.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.