Material recognition from an image
US9025866B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Jun 27, 2013 |
| Grant date | May 5, 2015 |
| Priority date | — |
| Expiry date | Jul 31, 2033 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06V10/85
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method of operating a computer system to perform material recognition based on multiple features extracted from an image is described. A combination of low-level features extracted directly from the image and multiple novel mid-level features extracted from transformed versions of the image are selected and used to assign a material category to a single image. The novel mid-level features include non-reflectance based features such as the micro-texture features micro-jet and micro-SIFT and the shape feature curvature, and reflectance-based features including edge slice and edge ribbon. An augmented Latent Dirichlet Allocation (LDA) model is provided as an exemplary Bayesian framework for selecting a subset of features useful for material recognition of objects in an image.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.