Patent · US Active

Error detection and rejection for a diagnostic testing system

US9029157B2 · kind B2 · utility

3Cited by
16References
18Claims
0Family size

Assignee

Inventors

Key dates

Filing dateApr 12, 2007
Grant dateMay 12, 2015
Priority date
Expiry dateMay 20, 2030

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10T436/11
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A system for measuring a property of a sample is provided. The system comprises a diagnostic measuring device having a memory and a diagnostic test strip for collecting the sample. The strip has embedded thereon a pattern representative of at least first data and second data, the first data being data representing at least one of parameters related to measuring the property, codes usable for calibration of the diagnostic measuring device, or parameters indicating proper connection between the measuring device and the test strip and the second data usable for detecting and rejecting potential errors affecting the proper measurement of the property.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.