Patent · US Active

Method and system for measuring a time constant of an integrated circuit, and integrated circuit provided with such a system

US9030213B2 · kind B2 · utility

0Cited by
15References
11Claims
0Family size

Assignee

Inventor

Key dates

Filing dateJan 28, 2010
Grant dateMay 12, 2015
Priority date
Expiry dateFeb 13, 2032

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH03H11/12
  • WIPO fieldBasic communication processes
  • WIPO sectorElectrical engineering

Abstract

A method and system for measuring a time constant RC of an integrated electronic circuit is provided. This integrated circuit may be made up of a first hardware component and of a second hardware component wherein one of the hardware components is a resistive element and the other is a capacitive element. The first and the second hardware components are connected to an inverting input of an operational amplifier of an integrator of a delta-sigma modulator. A DC voltage is applied to the modulator input. The output signal Qs of the modulator is measured with the aid of an analog/digital converter, and the value of the time constant RC is determined on the basis of at least one measurement of the level of the DC component of the output signal Qs of the modulator carried out with the air of a measurement counter circuit.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.