Patent · US Active

Method and system for rapid three-dimensional shape measurement

US9030470B2 · kind B2 · utility

6Cited by

2References

19Claims

0Family size

Assignee

Hong Kong Applied Science and Technology Research Institute Company Limited · CN

Inventors

Zhao Wang · Sha Tin, CN
Ying Liu · Shanghai, CN

Key dates

Filing date	Aug 14, 2012
Grant date	May 12, 2015
Priority date	—
Expiry date	Jul 11, 2033

Classification

Technology area (CPC G)Physics
CPC primaryG01B11/2509
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

The present invention discloses a non-contact measurement system for measuring the three-dimensional (3D) shape of an object rapidly by using a unique light pattern and the implementation method thereof. The system comprises a pattern generation unit, a projection unit, a sensing unit and a processing unit. The pattern generation unit generates an enhanced color sequence according to predetermined rules. The sensing unit of the system comprises a hybrid sensor which can be operated in fast mode or precise mode. A dedicated decoding method for the present invention is also disclosed.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.