Patent · US Active

Dual wafer stage exchanging system for lithographic device

US9030648B2 · kind B2 · utility

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1References
4Claims
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Assignee

Inventors

Key dates

Filing dateApr 2, 2010
Grant dateMay 12, 2015
Priority date
Expiry dateAug 15, 2032

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG03F7/70716
  • WIPO fieldOptics
  • WIPO sectorInstruments

Abstract

A dual wafer stage exchanging system for a lithographic device is disclosed, said system comprises two wafer stages running between an exposure workstation and a pre-processing workstation, and said two stages are set on a base and suspended above the upper surface of the base by air bearings. Each wafer stages is passed through by a Y-direction guide rail respectively, wherein one end of said guide rail is connected with a main driving unit and another end of said guide rail is detachably coupled with one of the two X-direction auxiliary driving units with single degree of freedom, and said two wafer stages are capable of moving in Y-direction along the guide rails and moving in X-direction under the drive of the auxiliary driving units with single degree of freedom. The position exchange of said two wafer stages can be enabled by the detachment and connection of the Y-direction guide rails and the auxiliary units with single degree of freedom.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.