X-ray source, X-ray imaging apparatus, and X-ray computed tomography imaging system
US9031201B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Jun 20, 2011 |
| Grant date | May 12, 2015 |
| Priority date | — |
| Expiry date | May 2, 2032 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG21K2207/005
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An X-ray imaging apparatus includes: an X-ray source including an electron source and a target, the target having a plurality of projections, each having an emitting surface; a diffraction grating configured to diffract X rays emitted from the X-ray source; and a detector configured to detect the X rays diffracted by the diffraction grating. Electron beams output from the electron source are incident on the emitting surfaces so that X rays are emitted from the emitting surfaces and are output to the diffraction grating. The X rays emitted from the emitting surfaces are diffracted by the diffraction grating so as to form a plurality of interference patterns. The projections are arranged such that bright portions of the interference patterns overlap each other and such that dark portions thereof overlap each other. Distances from the emitting surfaces to the diffraction grating are equal to each other.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.