Method of analyzing the wear of a non volatile memory embedded in a secure electronic token
US9032121B2 · kind B2 · utility
1Cited by
0References
13Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Oct 19, 2010 |
| Grant date | May 12, 2015 |
| Priority date | — |
| Expiry date | Nov 28, 2030 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C16/3495
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
The invention is a method of analyzing the wear of a non volatile memory embedded in a secure electronic token. A set of events are intended to generate writing and/or erasing operations in said memory. The token comprises a buffer. The method comprises the following steps: each time an event belonging to said set occurs, generating a data which reflects the event and storing said data in the buffer, sending the buffer to a remote machine, analyzing the buffer to determine the wear of the memory.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.