Patent · US Active

Liquid deposition photolithography

US9034568B2 · kind B2 · utility

45Cited by
1References
18Claims
0Family size

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Inventors

Key dates

Filing dateMar 22, 2013
Grant dateMay 19, 2015
Priority date
Expiry dateMay 3, 2033

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG03F7/70341
  • WIPO fieldOptics
  • WIPO sectorInstruments

Abstract

Systems and methods for liquid deposition photolithography are described. In particular, some embodiments relate to systems and methods for using photolithography to control the 2D structure of a thin layer of material (e.g., photopolymer) using various masks, projection optics and materials. In one or more embodiments, this thin layer can be manipulated by micro-fluidic techniques such that it can be formed, patterned and post-processed in a liquid environment, vastly simplifying the creation of multi-layer structures. Multiple layers are rapidly built up to create thick structures of possibly multiple materials that are currently challenging to fabricate by existing methods.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.