System and method for pattern detection and camera calibration
US9036037B1 · kind B1 · utility
20Cited by
1References
3Claims
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Key dates
| Filing date | Jan 24, 2012 |
| Grant date | May 19, 2015 |
| Priority date | — |
| Expiry date | Apr 16, 2033 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06V2201/12
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
Detecting a pattern in an image by receiving the image of a pattern and storing the image in a memory, where the pattern is composed of shapes that have geometrical properties that are invariant under near projective transforms. In some embodiments the process detects shapes in the image using the geometrical properties of the shapes, determines the alignment of the various shapes, and, corresponds or matches the shapes in the image with the shapes in the pattern. This pattern detection process may be used for calibration or distortion correction in optical devices.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.