Architectural pattern detection and modeling in images
US9036915B2 · kind B2 · utility
4Cited by
1References
20Claims
0Family size
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Key dates
| Filing date | Jan 27, 2011 |
| Grant date | May 19, 2015 |
| Priority date | — |
| Expiry date | Jul 21, 2031 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06V20/39
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Systems and methods are provided to facilitate architectural modeling. In one aspect, repetitive patterns are automatically detected and analyzed to generate modeled structural images such as building facades. In another aspect, structural symmetry is analyzed to facilitate architectural modeling and enhanced image generation.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.