Nondestructive examination of structures having embedded particles
US9042516B2 · kind B2 · utility
3Cited by
8References
21Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Oct 9, 2012 |
| Grant date | May 26, 2015 |
| Priority date | — |
| Expiry date | Feb 13, 2033 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10T428/24917
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A system comprises a structure having particles embedded at a level within the structure, and X-ray imaging apparatus for capturing images of the particles at the level.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.