Methods of using temperature control devices in electron microscopy
US9048065B2 · kind B2 · utility
9Cited by
11References
14Claims
0Family size
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Key dates
| Filing date | Sep 23, 2010 |
| Grant date | Jun 2, 2015 |
| Priority date | — |
| Expiry date | Sep 23, 2030 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J2237/28
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
Methods of using temperature control devices in electron microscopes. The temperature of the device structure may be controlled to extract information about reactions and processes that was previously unobtainable.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.