Patent · US Active

Nitride semiconductor and nitride semiconductor crystal growth method

US9048100B2 · kind B2 · utility

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11Claims
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Key dates

Filing dateNov 20, 2008
Grant dateJun 2, 2015
Priority date
Expiry dateJun 29, 2030

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10H20/0137
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A base at least one principal plane of which is a nitride is prepared for use in epitaxial growth. The base is placed on a susceptor in an epitaxial growth reactor and heated to a predetermined temperature (step A). The heating is started with inactive, nitrogen gas being supplied into the reactor. Then, active, NH3 gas is supplied. Then, a growth step (step B) of a first nitride semiconductor layer is started without an intervening step of thermally cleaning the principal nitride plane of the base. In step B, the first nitride semiconductor layer is epitaxially grown on a principal nitride plane of a base without supply of an Si source material. Then, a relatively thick, second nitride semiconductor layer is epitaxially grown on the first nitride semiconductor layer by supplying an n-type dopant source material (step C).

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.