Patent · US Active

Treatment method of a getter material and encapsulation method of such getter material

US9051173B2 · kind B2 · utility

2Cited by
8References
14Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 5, 2010
Grant dateJun 9, 2015
Priority date
Expiry dateOct 23, 2033

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/16195
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A treatment method for a getter material is provided, including forming a protective layer on the thin layer getter material by performing at least one oxidation and/or nitriding step of the thin layer getter material conducted under dry atmosphere of dioxygen and/or dinitrogen, wherein the protective layer is composed of oxide and/or nitride of the thin layer getter material, and wherein a thickness of the protective layer is between approximately 1 nm and 10 nm.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.