Panel inspection method and apparatus
US9052295B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Aug 22, 2013 |
| Grant date | Jun 9, 2015 |
| Priority date | — |
| Expiry date | Dec 18, 2033 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N21/95
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Provided are a panel inspection method and apparatus, the panel inspection method including: (a) determining if a variance value of luminance of a captured image of a panel is greater than a reference value, and searching for an original image and at least one secondary reflective image of a defect of the panel if it is determined that the variance value is greater than the reference value; and (b) determining whether the defect is an actual defect or an impurity disposed on the panel based on at least one of a difference in a luminance characteristic between the original image and the secondary reflective image and a number of the searched secondary reflective image.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.