System for detecting a laser attack on an integrated circuit chip
US9052345B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 18, 2012 |
| Grant date | Jun 9, 2015 |
| Priority date | — |
| Expiry date | May 17, 2033 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04L2209/12
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A system for detecting a laser attack on an integrated circuit chip formed in a semiconductor substrate, including a detection device capable of detecting voltage variations of the substrate. The system includes P-type first wells and N-type second wells extending in a P-type upper portion of the substrate; an N-type buried layer extending under at least a portion of the first and second wells; biasing contacts for the second wells and the buried layer; ground contacts for the first wells; and substrate contacts for detecting a substrate voltage, the detection contacts surrounding the first and second wells. The detection device comprises a resistor having a first terminal connected to said ground contacts of the first wells and a second terminal connected to said substrate contacts; and a comparator connected in with the resistor configured to detect a potential difference across the resistor.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.