Determining correspondence mappings from infrared patterns projected during the projection of visual content
US9052575B2 · kind B2 · utility
1Cited by
4References
19Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jul 12, 2007 |
| Grant date | Jun 9, 2015 |
| Priority date | — |
| Expiry date | Mar 23, 2034 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06V10/62
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method performed by a display system is provided. The method includes projecting a first infrared pattern from a first projection plane of a first projector into a scene, capturing the first infrared pattern from the scene in a capture plane of at least one image capture device, and determining a first correspondence mapping between the first projector and the image capture device from at least the first infrared pattern in the first projection plane and the first infrared pattern in the capture plane.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.