Patent · US Active

System and method utilizing time-slice-eradication to eliminate the effects of wavelength non-linearities from swept-wavelength testing of optical components for sources with non-linearities

US9057665B2 · kind B2 · utility

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15Claims
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Key dates

Filing dateJul 21, 2012
Grant dateJun 16, 2015
Priority date
Expiry dateDec 17, 2033

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01M11/335
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A system and method for correcting non-linearities in the output of a tunable laser over a sweep range. Electromagnetic radiation is directed over a range of wavelengths to a measurement system from the tunable laser source, wherein the measurement system collects data over the range of wavelengths. The electromagnetic radiation emitted over the range of wavelengths is monitored. A non-linearity in one or more wavelengths over the range of wavelengths is determined. A signal is transmitted to the measurement system to cease collecting data when the one or more wavelengths having the non-linearity is output from the tunable laser source or the data is ignored.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.