Forming regions characterized by labeled measurements
US9058666B2 · kind B2 · utility
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20Claims
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Key dates
| Filing date | Mar 15, 2013 |
| Grant date | Jun 16, 2015 |
| Priority date | — |
| Expiry date | Jul 2, 2033 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/20016
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Briefly, embodiments of methods and/or apparatuses for processing, at a variety of scale levels, labeled measurements in sub-regions to form a region characterized by a set of labeled measurements is described.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.