Patent · US Active

Hash functions used to track variance parameters of resistance-based memory elements

US9058870B2 · kind B2 · utility

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Key dates

Filing dateFeb 8, 2013
Grant dateJun 16, 2015
Priority date
Expiry dateDec 30, 2033

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C13/004
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

Parameters indicative of resistance variance of the memory elements are tracked. The resistance variance affects values of data stored in the resistance-based memory elements. A hash function is performed for each memory element. The hash function returns a reference to one of a plurality of counter elements. A value of each counter element is modified in response to the tracked parameter data of the associated memory element. Read operations affecting the memory elements are adjusted based on the values for the associated counter elements.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.