Ion trap quadrupole mass filter
US9058965B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 5, 2013 |
| Grant date | Jun 16, 2015 |
| Priority date | — |
| Expiry date | Dec 17, 2033 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10T29/49826
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
An ion trap mass spectrometer is provided, including: an electron emitter; an ion trap storing ions generated by ionization resulting from an impact with electrons emitted from the electron emitter; a secondary ion filter for blocking out secondary ions generated due to ions selectively released by the ion trap; and a detector detecting ions selectively released from the ion trap, wherein the electron emitter, the ion trap, the secondary ion filter, and the ion detector are arranged on the same axis, so that a pure mass spectrum can be measured by excluding the secondary ions which are causes of background noise signals in the procedure of detection of the ions by the ion trap mass spectrometer.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.