Patent · US Active

Micro-reflectron for time-of-flight mass spectrometer

US9058968B2 · kind B2 · utility

10Cited by
6References
23Claims
0Family size

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Key dates

Filing dateSep 4, 2013
Grant dateJun 16, 2015
Priority date
Expiry dateSep 4, 2033

Classification

  • Technology area (CPC B)Performing Operations; Transporting
  • CPC primaryB81C2203/031
  • WIPO fieldElectrical machinery, apparatus, energy
  • WIPO sectorElectrical engineering

Abstract

A micro-reflectron for a time-of-flight mass spectrometer including a substrate and integrated with the volume of the substrate, means for application of a potential gradient in a volume suitable for constituting a flight zone of the ions. The means of application includes at least two polarization electrodes and a wall of at least one resistive material that can be polarized between these electrodes so as to generate a continuous potential gradient, itself providing the function of reflectron, this flight zone, these electrodes and this wall being obtained by the technology of microelectromechanical systems (MEMS) and this micro-reflectron having a thickness of less than 5 millimetres while its other dimensions are less than 10 times this thickness.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.