Interface for a test system
US9063170B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 27, 2012 |
| Grant date | Jun 23, 2015 |
| Priority date | — |
| Expiry date | Nov 25, 2033 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/2889
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An example test system includes: a pin electronics board for exchanging signals with a device under test (DUT), where the pin electronics board includes first electrical contacts; an interposer between the pin electronics board and a paddle board, where the paddle board includes second electrical contacts, and where the interposer includes electrical connectors for use in establishing electrical pathways between the first electrical contacts and the second electrical contacts; and an actuator configured to force the paddle board and the interposer to make contact so as to cause the electrical connectors to contact the second electrical contacts and thereby establish the electrical pathways.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.