Method, apparatus and computer program product for estimating image parameters
US9064170B2 · kind B2 · utility
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2References
17Claims
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Key dates
| Filing date | Jan 11, 2013 |
| Grant date | Jun 23, 2015 |
| Priority date | — |
| Expiry date | Jul 16, 2033 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06V10/758
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
In accordance with an example embodiment a method, apparatus and computer program product are provided. The method comprises determining at least one first 1-D curve and at least one second 1-D curve. The method also comprises computing alignment parameters indicative of alignment adjustment between the at least one first 1-D curve and the at least one second 1-D curve. A scaling parameter and at least one translation parameter may be computed between the at least one first 1-D curve and the at least one second 1-D curve based at least on the alignment parameters.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.