Specimen mount for microscopy
US9064672B2 · kind B2 · utility
8Cited by
9References
17Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Dec 22, 2008 |
| Grant date | Jun 23, 2015 |
| Priority date | — |
| Expiry date | May 12, 2031 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J2237/2008
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Mounts, stages, and systems that allow for in situ manipulation, experimentation and analysis of specimens directly within an electron microscope. The mounts fixture and interface with a device, wherein the device corresponds to a structure that holds a specimen for microscopic imaging. The mounts are mateably and/or electrically compatible with a stage. Systems using the devices, mounts, and stages that can be used directly within the electron microscope are disclosed.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.