Method and system for vicarious spatial characterization of a remote image sensor
US9068886B2 · kind B2 · utility
8Cited by
3References
13Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jul 29, 2011 |
| Grant date | Jun 30, 2015 |
| Priority date | — |
| Expiry date | Sep 23, 2034 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01J3/2803
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method and a system for vicarious characterization of a remote sensing sensor are described. The system includes a plurality of reflective mirrors configured and arranged to reflect radiation from a source of radiation onto a remotely located radiation sensor. The plurality of mirrors are spaced apart so as to obtain a plurality of distinct spot images on the remotely located radiation sensor. The system further includes a processor configured to analyze the plurality of spot images by fitting the images to obtain a point spread function of the remote sensing sensor.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.