Methods for testing wireless electronic devices using automatic self-test mode
US9069037B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jan 26, 2012 |
| Grant date | Jun 30, 2015 |
| Priority date | — |
| Expiry date | Oct 10, 2033 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/2843
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A device under test (DUT) may be tested using a radio-frequency test station. The DUT may include at least one antenna, wireless communications circuitry associated with the antenna, and other peripheral components such as a camera module, a display module, and audio circuitry. The test station may include a shielded enclosure in which the DUT is placed during testing. The DUT need not be electrically wired to any test equipment. The DUT may be configured to operate in self test mode. The DUT may be configured to obtain baseline noise floor measurements while all the peripheral components are deactivated and may be configured to obtain elevated noise floor measurements while selectively activating desired subsets of the peripheral components. The difference between the elevated and baseline noise floor measurements may be computed to determine whether at least some of the peripheral components negatively impact the antenna performance by an excessive amount.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.