Methods for characterizing tunable radio-frequency elements in wireless electronic devices
US9070968B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Apr 2, 2012 |
| Grant date | Jun 30, 2015 |
| Priority date | — |
| Expiry date | Dec 12, 2033 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04B17/103
- WIPO fieldTelecommunications
- WIPO sectorElectrical engineering
Abstract
A wireless electronic device may contain an antenna tuning element for tuning the device's operating frequency range. The antenna tuning element may include radio-frequency switches, continuously/semi-continuously adjustable components such as tunable resistors, inductors, and capacitors, etc. A test system may be used to measure the radio-frequency characteristics associated with the tuning element assembled with an electronic device. The test system may include a test host, a test chamber, a signal generator, power meters, and radio-frequency testers. The electronic device under test (DUT) may be placed in the test chamber. The signal generator may generate radio-frequency test signals for energizing the antenna tuning element. The power meters and radio-frequency testers may be used to measure conducted and radiated signals emitted from the DUT while the DUT is placed in different desired orientations. A phantom object is optionally placed in the vicinity of the DUT to simulate actual user scenario.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.