Multiple concurrent spectral analyses

US9074937B2 · kind B2 · utility

Assignee

• HEWLETT-PACKARD DEVELOPMENT COMPANY, L.P. · US

Inventors

• Huei Pei Kuo · Cupertino, US
• Zhiyong Li · Foster City, US
• Shih-Yuan Wang · Palo Alto, US
• Steven Barcelo · Palo Alto, US
• Ansoon Kim · Mountain View, US
• Gary Gibson · Palo Alto, US
• Alexandre M. Bratkovski · Mountain View, US

Key dates

• Filing date: Jan 30, 2013
• Grant date: Jul 7, 2015
• Expiry date: Apr 28, 2033

Classification

• Technology area (CPC G): Physics
• CPC primary: G01J3/4406
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

According to an example, apparatuses for performing multiple concurrent spectral analyzes on a sample under test include an optical system to concurrently direct a plurality of light beams onto analytes at multiple locations on the sample under test, in which the plurality of light beams cause light in either or both of a Raman spectra and a non-Raman spectra to be emitted from the analytes at the multiple locations of the sample under test. The apparatuses also include a detector to concurrently acquire a plurality of spectral measurements of the light emitted from the analytes at the multiple locations of the sample under test. Example methods of performing spectral analysis include use of the apparatuses.