Patent · US Active

Test probe with integrated test transformer

US9081035B2 · kind B2 · utility

1Cited by

3References

18Claims

0Family size

Assignee

Rohde & Schwarz GmbH & Co. KG · DE

Inventors

Andrea Deutinger · Forstern, DE
Gerd Hechtfischer · Vaterstetten, DE
Christian Evers · Tauberbischofsheim, DE

Key dates

Filing date	Jan 20, 2011
Grant date	Jul 14, 2015
Priority date	—
Expiry date	Nov 12, 2031

Classification

Technology area (CPC G)Physics
CPC primaryG01R1/06766
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A measuring device used for registering a test signal originating from a circuit structure applied to a wafer. The measuring device provides at least one test probe and at least one test transformer. The at least one test transformer is connected to the at least one test probe in an electrically conductive manner. In this context, the test transformer is arranged on the test probe.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.