Methods, device and installation for locating a defect in an electric link
US9081047B2 · kind B2 · utility
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6Claims
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Key dates
| Filing date | Aug 29, 2013 |
| Grant date | Jul 14, 2015 |
| Priority date | — |
| Expiry date | Aug 29, 2033 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/088
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for locating a defect in an electric link includes measuring at least one part of components of an electromagnetic field in a vicinity of an estimated location of the defect at plural places along the link; deducing, via a processor, from the measuring an estimation of variation of at least the part of the components of the electromagnetic field along the electric link in a vicinity of the estimated location of the defect; and estimating, via the processor, a new location of the defect as a function of the estimated variation of at least the part of the components of the electromagnetic field.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.