Patent · US Active

Method of optimizing lithography tools utilization

US9081306B2 · kind B2 · utility

1Cited by
2References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 19, 2012
Grant dateJul 14, 2015
Priority date
Expiry dateJan 11, 2034

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/67155
  • WIPO fieldOptics
  • WIPO sectorInstruments

Abstract

A lithography cluster includes at least two lithography cells having a first lithography cell and a second lithography cell, an interface unit configured to integrate with the first lithography cell and the second lithography cell. The first lithography cell includes a first track and a first exposing tool and a second lithography cell includes a second track and a second exposing tool. The interface station includes a first interface buffer configured to couple the first track, a second interface buffer configured to couple the second track, a conveyor configured to couple the first interface buffer and the second interface buffer, and a robot configure to move along the conveyor, where in the robot transfers a substrate between functions of multiple functions within the first lithography cell, the second lithography cell, or between the first lithography cell and the second lithography cell.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.