Method of defect image classification through integrating image analysis and data mining
US9082009B2 · kind B2 · utility
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9Claims
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Key dates
| Filing date | Jan 14, 2014 |
| Grant date | Jul 14, 2015 |
| Priority date | — |
| Expiry date | Feb 7, 2034 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30148
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method for classifying defect images is provided. Defect images are processed through an automatic optical detection. The present invention integrates image analysis and data mining. Defects are found on the images without using human eye. The defects are classified for reducing product defect rate. Thus, the present invention effectively enhances performance on finding and classifying defects with increased consistency, correctness and reliability.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.