Resistance measurement system and method of using the same
US9085464B2 · kind B2 · utility
1Cited by
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20Claims
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Key dates
| Filing date | Mar 7, 2012 |
| Grant date | Jul 21, 2015 |
| Priority date | — |
| Expiry date | Apr 13, 2032 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N27/04
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A quality control system for the manufacture of carbon nanostructure-laden substrates includes a resistance measurement module for continuously measuring resistance of the carbon nanostructure (CNS)-laden substrate.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.