Patent · US Active

Method of manufacturing a probe comprising a cantilever with a conduit

US9086431B2 · kind B2 · utility

0Cited by
5References
7Claims
0Family size

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Inventor

Key dates

Filing dateJan 13, 2012
Grant dateJul 21, 2015
Priority date
Expiry dateMay 28, 2032

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10T29/49002
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

The present invention relates to a method of manufacturing a probe comprising a cantilever with a conduit. According to the invention, an etchant window is provided in a layer covering an elongated sacrificial conduit core that is to form the conduit. This allows for an etching process where the elongated sacrificial conduit core is etched away before all material of a substrate is etched away, the remaining material of the substrate material making the probe stronger without being in the way during use of the probe.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.