Patent · US Active

Determining similarity scores of anomalies

US9087089B2 · kind B2 · utility

0Cited by

6References

15Claims

0Family size

Assignee

HEWLETT-PACKARD DEVELOPMENT COMPANY, L.P. · US

Inventors

Ruth Bernstein · Nes Ziona, IL
Ira Cohen · Urbana, US
Chen Kahana · Gan Yavne, IL

Key dates

Filing date	Jun 9, 2010
Grant date	Jul 21, 2015
Priority date	—
Expiry date	Dec 20, 2030

Classification

Technology area (CPC G)Physics
CPC primaryG06F11/3616
WIPO fieldComputer technology
WIPO sectorElectrical engineering

Abstract

A method and system comprise abstracting configuration items (CI) in at least a first anomaly and a second anomaly based on type of CI. Further, CIs are matched of a common type between the first and second anomalies based on a cost function. Additionally, a similarity score is computed for the first and second anomalies based, at least in part, on the cost function of the matched CI's and based on topology of the first and second anomalies.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.