Calibration system and method for a three-dimensional measurement system
US9091530B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 10, 2014 |
| Grant date | Jul 28, 2015 |
| Priority date | — |
| Expiry date | Jun 10, 2034 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B21/042
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A calibration system for a three-dimensional measurement system having a calibration standard assembly positioned in a large scale three-dimensional volumetric area. The calibration standard assembly has a stable base portion and a plurality of structural members disposed on the stable base portion. The calibration standard assembly has a plurality of target position nests coupled to the plurality of structural members. Each target position nest has a known three-dimensional location determined with a coordinate measuring device and a plurality of retroreflective targets. The calibration standard assembly has a plurality of calibration targets each having a same diameter as a diameter of each of the retroreflective targets. The calibration system has a three-dimensional measurement system for measuring locations of the plurality of calibration targets. The plurality of calibration targets are three-dimensional standards having known three-dimensional locations that are used in calibration of the three-dimensional measurement system.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.