Photoluminescence quantum yield (PLQY) test of quantum dot (QD) films
US9091655B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 11, 2014 |
| Grant date | Jul 28, 2015 |
| Priority date | — |
| Expiry date | Mar 11, 2034 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01J3/443
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Photoluminescence quantum yield (PLQY) testing of quantum dots is described. In one embodiment, a method involves heating a sample including quantum dots and illuminating the sample with a light source. The method involves measuring spectra of luminescence from the illuminated quantum dots of the sample at each of a plurality of temperatures. The method involves measuring each of the plurality of temperatures with a temperature sensor. The PLQY at each of the plurality of temperatures is computed based on the measured spectra. The method further involves computing a relationship between QD emission wavelength of the measured spectra and the plurality of temperatures measured with the temperature sensor. The relationship is used to determine the QD temperature corresponding to each of the PLQY computations. In one embodiment, an integrating sphere moves on a gantry over the samples.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.