Method and apparatus for measuring performance of electronic device
US9091716B2 · kind B2 · utility
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2References
20Claims
0Family size
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Key dates
| Filing date | Oct 4, 2012 |
| Grant date | Jul 28, 2015 |
| Priority date | — |
| Expiry date | May 29, 2033 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04M1/24
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method and an apparatus for measuring performance of an electronic device are provided. The apparatus includes an electromagnetic wave measuring device for measuring an actual level of an electromagnetic wave of an electronic device, and an analysis controller for applying a previously stored level change value to the actual level of the electromagnetic wave to compute a measured level of the electromagnetic wave. The method and the apparatus for measuring performance of an electronic device can easily measure an electromagnetic wave level of the electronic device without using a device suggested by an international standard.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.