Method and system for correlated tracing with automated multi-layer function instrumentation localization
US9092568B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Apr 30, 2013 |
| Grant date | Jul 28, 2015 |
| Priority date | — |
| Expiry date | Jul 11, 2033 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/3604
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A system for automatically instrumenting and tracing an application program and related software components achieves a correlated tracing of the program execution. It includes tracing of endpoints that are the set of functions in the program execution path that the developers are interested. The tracing endpoints and related events become the total set of functions to be traced in the program (called instrument points). This invention automatically analyzes the program and generates such instrumentation points to enable correlated tracing. The generated set of instrumentation points addresses common questions that developers ask when they use monitoring tools.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.