System, method, and computer program product for testing device parameters
US9092573B2 · kind B2 · utility
8Cited by
24References
18Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jul 6, 2012 |
| Grant date | Jul 28, 2015 |
| Priority date | — |
| Expiry date | Mar 28, 2033 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/3676
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A system, method, and computer program product are provided for testing device parameters. In use, a plurality of device parameters is determined, utilizing a directed acyclic graph (DAG). Further, the determined plurality of device parameters is tested.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.