Exam type mapping
US9092727B1 · kind B1 · utility
40Cited by
136References
27Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Aug 10, 2012 |
| Grant date | Jul 28, 2015 |
| Priority date | — |
| Expiry date | Apr 22, 2033 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG16H40/63
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Provided herein are various systems and methods of using an exam type data structure to map exam types in various formats to master exam types that may be associated with customized rules or other features.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.