Patent · US Active

Deflection indication gauge

US9097620B2 · kind B2 · utility

9Cited by

48References

10Claims

0Family size

Assignee

Appvion, LLC · US

Inventors

Kelly John Caron · Suamico, US
Ruth Monica Prasetio · Appleton, US

Key dates

Filing date	Feb 14, 2013
Grant date	Aug 4, 2015
Priority date	—
Expiry date	Aug 2, 2033

Classification

Technology area (CPC G)Physics
CPC primaryG01N2203/0682
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A method, and apparatus, for determining bend resistance of a sample includes applying a weight to a sample and measuring an amount of deflection of the sample caused by applying the weight. The sample is provided on a sample holder and an initial position of the sample is measured with respect to the sample holder. A weight is applied to the sample and a change in position from the initial position to a deflection position of the sample due to the weight applied to the sample is measured. An amount of deflection of the sample is determined by dividing the change in position by the basis weight.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.