Synchronized voltage scaling and device calibration
US9098438B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Aug 25, 2011 |
| Grant date | Aug 4, 2015 |
| Priority date | — |
| Expiry date | Dec 21, 2033 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY02D10/00
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method is provided for scaling voltage in an integrated circuit. A calibration operation is performed on a functional module on the integrated circuit periodically at a rate T1. At least one parameter on the integrated circuit in monitored to determine when a performance threshold is reached. A change is initiated to an operating voltage for a portion of the integrated circuit in response to reaching the threshold. The rate of performing calibration operation is increased to a higher rate T2 for a window of time W in response to initiating the change in operating voltage, after which the rate of performing calibration is returned to the rate T1.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.