Modeling anisotropic surface reflectance with microfacet synthesis
US9098945B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | May 1, 2009 |
| Grant date | Aug 4, 2015 |
| Priority date | — |
| Expiry date | Mar 20, 2032 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T15/506
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Described is a search technology in which spatially varying anisotropic reflectance is modeled using image data captured from a single view. Reflectance at each point is represented using a microfacet-based Bidirectional Reflectance Distribution Function (BRDF). Modeling processes the image data, which provides a partial normal distribution function (NDF) for each surface point. The NDF at each selected point is completed by texture synthesis using similar, overlapping partial NDFs from other points. Also described is a scanning device that illuminates a sample surface from a two-dimensional set of light directions using a linear array of LEDs moved over a flat sample.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.