Measurement system of a light source in space

US9103661B2 · kind B2 · utility

Assignee

• CSEM CENTRE SUISSE D'ELECTRONIQUE ET DE MICROTECHNIQUE SA—RECHERCHE ET DÉVELOPPEMENT · CH

Inventors

• Eric Grenet · Neuchâtel, CH
• Peter Masa · La Chaux-de-Fonds, CH
• Edoardo Franzi · Cheseaux-Noréaz, CH
• David Hasler · Neuchâtel, CH

Key dates

• Filing date: Jul 14, 2011
• Grant date: Aug 11, 2015
• Expiry date: Dec 8, 2031

Classification

• Technology area (CPC G): Physics
• CPC primary: G01S3/7835
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

A system measures the position of a light source in space using an imager and transparent surface with a pattern on top. The pattern consists of a repetitive pattern and a distinctive element. The system achieves sub-micron precision. It also handles the measurement of several light sources simultaneously, and the measurement of the position of a retroreflector instead of the light.