Patent · US Active

Method and device for identifying a material

US9103774B2 · kind B2 · utility

0Cited by

1References

23Claims

0Family size

Assignee

Fraunhofer-Gesellschaft zur förderung der angewandten Forschung e.V. · DE

Inventors

Bernd Sartorius · Berlin, DE
Helmut Roehle · Berlin, DE
Dennis Stanze · Berlin, DE

Key dates

Filing date	Oct 25, 2010
Grant date	Aug 11, 2015
Priority date	—
Expiry date	Apr 25, 2032

Classification

Technology area (CPC G)Physics
CPC primaryG01N21/90
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A material may be identified using THz radiation that simultaneously or sequentially includes at least one first frequency portion and a second frequency portion different therefrom. An object formed from the material to be identified is irradiated with the THz radiation and the THz radiation exiting the object is detected using a phase-sensitive THz receiver. A time or phase offset, caused by the object, is measured at least for the first frequency portion and a material thickness is determined therefrom. Attenuation of the received signal, at least for the second frequency portion, is determined. An absorption coefficient for at least the second frequency portion is calculated using the material thickness.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.