Differential phase-contrast imaging with improved sampling
US9105369B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Aug 26, 2011 |
| Grant date | Aug 11, 2015 |
| Priority date | — |
| Expiry date | Dec 6, 2031 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG21K2207/005
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present invention relates to differential phase-contrast imaging of an object. For increasing spatial resolution of an X-ray imaging system (2) the size of a detector pixel element (8) may be considered a limiting factor. Accordingly, it may be beneficial to increase the resolution of an apparatus (38) for phase-contrast imaging without further reducing the area of an individual pixel element (8). Accordingly, an apparatus (38) for phase-contrast imaging with improved sampling is provided, comprising an X-ray source (4), a first grating element G1 (24), a second grating element G2 (26) and an X-ray detector element (6) comprising a plurality of detector pixel elements (8), each detector pixel element (8) having a pixel area A. An object to be imagined (14) is arrangeable between the X-ray source (4) and the X-ray detector element (6). The first grating element G1 (24) as well as the second grating element G2 (26) are arrangeable between the X-ray source (4) and the X-ray detector element (6). The X-ray source (4), the first grating element G1 (24), the second grating element G2 (26) and the X-ray detector (6) are operatively coupled for acquisition of a phase-contrast image of …
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.